Indentors, probe sensors, standard samples

Probe sensors

The NanoScan devices are based on the principles of scanning force microscopy. The main difference of NanoScan nano-hardness testers is the use of a piezoresonant cantilever of a tuning fork design with high bending stiffness of the console (~2 X 104 N/m).

The use of the resonant oscillation mode allows to control the contact of the probe tip with the surface according to two parameters: change of amplitude and frequency of the probe oscillations. This makes it possible to separate the viscous and elastic components of interaction of the tip with the surface respectively and to distinguish between the elastic surface and the viscous contamination on it, which inevitably occurs in the open air, as well as to measure the mechanical properties of the surfaces. The high bending stiffness of the probe arm allows to penetrate through the viscous layer up to the contact with the elastic surface, and to modify the surface (indentation and scratching).

The design of the probe allows the use of different types of diamond tips. The listed functionalities significantly distinguish the NanoScan microhardness testers and nanohardness testers from the commercial instruments available today.

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An indentor is a hard tip of a certain shape. It is used to press into the material to be tested and to make scratches. Indenters differ in material (diamond, sapphire, ...) and geometry (pyramid, sphere, ...).
Berkowitz type indentor: trihedral pyramid, angle between pyramid axis and face 65.30. Equivalent angle of the cone 70.320. Radius of curvature of indenter point less than 100 nm.
Vickers-type indenter: tetrahedral pyramid, angle between the edges 1480. Equivalent cone angle of 70.30.
The indenters offered on the site can be supplied both in the NanoScan holder and separately.

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Indentors

The standard sample (enterprises) - SSE - is made of a known material, the surface of which is prepared according to a special technique. SSEs are intended for calibration of nanohardness meters of "NanoScan" family and are certified according to the procedure established in FSBSI TISNCM. Each standard sample is accompanied by the SSE passport, which contains normalized metrological characteristics, order of application, transportation and storage conditions.

Standard samples

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Download GOST 9377-81 (indenters)
in pdf format (445 Kb) (rus)

«NanoScan-3D»

Beam type sensor "NanoScan-3D"

NanoScan sensor
beam type

«Super NanoScan»

«NanoScan-3D»

Piezoceramic chamber probe "NanoScan-Compact", "Super NanoScan"

NanoScan sensor
tuning fork

«NanoScan-3D»

Piezo-ceramic tuning fork sensor "NanoScan-3D"

NanoScan sensor
tuning fork

All NanoScan instruments

Piezo-ceramic chamber probe "NanoScan"

NanoScan sensor
tuning fork

Attributed characteristics:

Hardness: 9.5 ± 1.0 GPa
Modulus of elasticity (Young's): 72.0 ± 3.0 GPa
Roughness: < 5 nm
Overall dimensions: Ø25×5 mm
Surface preparation: deep grinding-polishing

Fused quartz

Attributed characteristics:

Hardness: 24.5 ± 2.5 GPa
Modulus of elasticity (Young's): 415.0 ± 35.0 GPa
Roughness: < 5 nm
Overall dimensions: Ø25×5 mm
Surface preparation: epi-polishing

Sapphire

Assigned characteristics:

Hardness: 0.5 ± 0.1 GPa
Modulus of elasticity (Young's): 70.0 ± 7.0 GPa
Roughness: < 5 nm
Overall dimensions: 10×10×8 mm
Surface preparation: polishing, removal of riveted layer by electrolytic etching

Aluminum

Attributed characteristics:

Hardness: 0.21 ± 0.02 GPa
Modulus of elasticity (Young's): 3 ± 0.3 GPa
Roughness: < 5 nm
Overall dimensions: 10×10×7 mm
Surface preparation: -

Polycarbonate