NanoScan-Compact
Posted By admin On November 13, 2009 @ 3:08 pm In News | 1 Comment
SPECIFICATION:
| Measurement modes: | Imaging in contact dynamic scanning mode (topography / elasticity modulus distribution map) XY scan step: 1.5 nm; Z scan step: 0.15 nm |
| Indentation / scratch (max. load up to 20 g.) |
|
| Force spectroscopy | |
| Range of measured values: |
hardness: up to 80 GPa elastic modulus: up to 1000 GPa |
| Scanning window: | XY – up to 100 µm Z – up to 10 µm |
| Cantilever: | Piezoceramic cantilever |
| Indentors: | Diamond pyramid of Berkovich type |
| Size of samples: | Up to 50х50 mm Up to 40 mm height Up to 1 kg |
| Sample positioning system: | XY: up to 50 mm, manual Z: up to 40 mm, 1 µm step, motorized |
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