NanoScan-3D
Posted By admin On November 13, 2009 @ 3:00 pm In News | No Comments
SPECIFICATION:
| Measurement modes: | Imaging in contact dynamic scanning mode (topography / elasticity modulus distribution map). XY scan step: 1.5 nm; Z scan step: 0.15 nm |
| Indentation / scratch (max. load up to 100 g.) |
|
| Force spectroscopy | |
| Instrumented nanoindentation | |
| Range of measured values: |
hardness: up to 80 GPa elastic modulus: up to 1000 GPa |
| Scanning window: | XY – up to 100 µm Z – up to 10 µm |
| Cantilever: | Piezoceramic cantilever |
| Indentors: | Diamond pyramid of Berkovich type |
| Optical high resolution system: | Video microscope with 260x – 1800x zoom |
| Size of samples: | Up to 100х100 mm Up to 80 mm height Up to 5 kg |
| Sample positioning system: |
XY: up to 100 mm, 1 µm step, motorized |
Article printed from: http://nanoscan.info/eng
URL to article: http://nanoscan.info/eng/products/equipment/nanoscan-3d/
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