Imaging
Obtaining the image of surface topography scanning
NanoScan scanning nanohardness testers allow obtaining three-dimensional surface topography images in the scanning probe microscopy mode. The scanning is performed in dynamic semicontact mode with a diamond tip attached to a piezoceramic probe. When surface is scanned with closed loop on frequency the contact stiffness is kept constant. This mode is recommended for materials with relatively high hardness and elastic modulus (metals and alloys, crystals, ceramics). In this mode the influence of surface contamination on the image quality is negligible.
When surface is scanned with closed loop on amplitude the viscous contact conditions are kept constant. This mode is suitable for relatively soft materials such as polymers and plastics.
The real imaging resolution is limited by the area of contact between the indentor and the surface. For imaging in open air conditions the real resolution is about 10 nm in lateral plane and better than 1 nm in normal direction. These are typical characteristics for scanning probe microscopes working in ambient environment.
The maximum scanning area is 100 x100 x10 µm.