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Publications
Posted By admin On December 21, 2009 @ 3:52 pm In News | No Comments
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Journal papers |
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[1] Mutual consistency of hardness testing at micro- and nanometer scales. |
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Features of application of nanoindentation method for measurement of hardness in the nanoscale. |
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Microcontroller control system for scanning microscope NanoScan. |
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Research and modifying of semi-conductor structures by diamond current-carrying probes. |
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Application of scanning probe microscopes and nano-hardness testers for studying mechanical properties of hard materials on nano-level (generalizing article). K.V.Gogolinsky, N.A.L’vova, A.S.Useinov. “ Factory laboratory. Diagnostics of materials ” №6,2007. Volume 73. pp.28 – 36 |
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Definition of crack resistance of fragile superhard materials on nano-level. A.I.Soshnikov, Н.А. L’vova, K.V.Gogolinsky, V.F.Kulibaba. Nanotekhnika, 2006, №1, p.64-67. |
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Influence of substrate materials on the properties of CdTe thin films grown by hot-wall epitaxy. Ye. Bilevych, A. Soshnikov, L. Darchuk, M. Apatskaya, Z. Tsybrii, M. Vuychik, A. Boka, F. Sizov, O. Boelling, B. Sulkio-Cleff. Journal of Crystal Growth 275 (2005) |
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Measurement of elastic modulus of superhard materials by means of scanning probe microscope NanoScan. . A.S.Useinov. Devices and technics of experiment, 2003, №6, p.1-5 |
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Elastic Properties of Dense Nanotube Layers. S. Grudzinskaya, Z. Ya. Kosakovskaya, V. N. Reshetov, A. A. Chaban. Acoustical Physics, Vol. 47, No. 5, 2001, pp. 548-551. |
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Mechanical properties of different types of diamonds. V.Blank, M.Popov, G. Pivovarov, N.Lvova, S.Terentev. Diamond and Related Materials 8 (1999), pp. 1531-1535. |
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Hard diamond-like layers produced during DIII-D tokamak operations. V. Denisov, L. Kuzik, N.Lvova et al. Physics Letters A 239 (1998), pp.328-331. |
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Ultrahard and superhard phases of fullerite C60: Comparison with diamond on hardness and wear. V.Blank, M.Popov, G.Pivovarov, N.Lvova, K.Gogolinsky, V.Reshetov. Diamond and Related Materials 7 (2-5) (1998), pp. 427-431. |
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Application of scanning probe microscopes for the analysis with sub-micron and nanometer structure resolution and distribution of mechanical properties of materials (review). Gogolinsky K.V., Reshetov V.N.Factory laboratory. Diagnostics of materials, 1998, № 6, V.64, p.30-43. |
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Nano-sclerometry measurements of superhard materials and diamond hardness using scanning force microscope with the ultrahard fullerite C60 tip. V.Blank, M.Popov, N.Lvova, K.Gogolinsky, V.Reshetov. J. Mater. Res., 12 (1997), 3109. |
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Conference proceedings |
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The experimental study of the perimeter plastic deformation during scratch hardness test. |
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Measurement of hardness with nanometer spatial resolution. |
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Features of application of various techniques of measurement of hardness in nano-scale. |
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Measurement of hardness of heterogeneous materials with nanometer spatial resolution. |
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Mutual consistency of mechanical testing at micro- and nanoscale. A. Useinov, K. Gogolinskiy, V. Reshetov. 9th European Symposium on nano-mechanical Testing, 2008 |
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Features of measurement of mechanical properties of superhard materials in nano-scale. |
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Methods of revealing and studying of properties of microdimensional areas of heterogeneity in crystals on the example of streaky-structured langasites. |
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Application of scanning nano-hardness tester NanoScan for research of mechanical properties in the nano-scale. |
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NanoScan measuring system: from microhardness to nanohardness. |
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Volt-ampere and volt-farad spectroscopy of semi-conductor structures by current-carrying diamond probes SPM.. A.I.Soshnikov, K.V.Gogolinsky, V.N.Reshetov. Materials of XV Russian symposium on raster electronic microscopy and analytical methods of research of hard bodies, 2007 |
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Modern methods of estimation of mechanical and tribological properties of functional surfaces.M.I.Petrzhik, D.V.Shtansky, E.A.Levashov. Materials of the X International scientific and technical conference “High technologies in the industry of Russia ”, 2004. |
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Publicism |
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Diamond accuracy of nanotechnologies. |
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We need nano so bad! |
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Diamonds for jewelry and measurements. |
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[1] Mutual consistency of hardness testing at micro- and nanometer scales.: http://nanoscan.info/eng http://www.ijmr.de/directlink.asp?MK110138
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